About Debangana Mukherjee

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So far Debangana Mukherjee has created 26 blog entries.
10 04, 2019

CISC awarded with 2 prestigious awards at the AIM industry honors at RFID Journal Live 2019

April 10th, 2019|Allgemein, News|0 Comments

CISC was awarded with two top industry awards at the annual AIM industry honors held at RFID Journal Live in Phoenix, Az last week. First the Ted William award, which was awarded to Josef Preishuber-Pflügl, Executive Vice - President CTO, Business Manager RFID+NFC, in recognition for his exception contribution to further the RFID industry through [...]

6 03, 2019

RFID Xplorer used for European EECC annual tag report

March 6th, 2019|Allgemein|0 Comments

European EPC Competence Center (EECC) has partnered with CISC on its latest annual report, titled "UHF RFID Transponder Benchmark (UTPS)” that helps retailers to determine which RFID tags they should be using, and highlights the costs and specific pain points each platform tackles. RFID Xplorer was used in the testing process as the “benchmark” test [...]

15 02, 2019
  • CISC Logo

Debangana Mukherjee is the new vice-chair for AIM NA

February 15th, 2019|Allgemein, Media, News|0 Comments

Debangana Mukherjee, Director Business Development+ Sales, is selected as the new vice-chair for AIM North America. Her selection in the leadership team further strengthens CISC's commitment towards development and promotion of the AIDC technology with particular focus on RAIN in the North American market. Attached is the full press release

8 02, 2019

CISC exhibiting at the RAIN RFID event in Memphis,TN from 5th-7th of March

February 8th, 2019|Allgemein, Events, News|0 Comments

Please visit our exhibit on RFID testing during the RAIN RFID event in Memphis, TN from 5th to 7th March. We will exhibit tests around reader phase sensitivity, EN 302 208 tag tests and ISO/IEC 18046-2 reader tests with RFID Xplorer.  For personalized demo please feel free to contact us.

5 02, 2019

CISC is exhibiting at RFID Journal Live, from 2nd to 4th April, 2019.

February 5th, 2019|Allgemein, Events|0 Comments

CISC will be exhibiting at RFID Journal Live, in Phoenix, AZ, USA. Please, feel free to stop by our booth #845 from April 2nd to 4th 2019 to see CISC RFID Xplorer is action. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all RAIN RFID tests: Tag performance testsTag conformance testsReader performance testsReader conformance tests with sniffer [...]

18 09, 2018

Debangana Mukherjee will speak at the Integrating AIDC in the Connected World Workshop on 26th Sept, at Label Expo 2018.

September 18th, 2018|Allgemein, Events, News|0 Comments

Join Debangana Mukherjee and other industry experts at  the Connected World Workshop on 26th Sept, at Label Expo 2018 in Chicago. Let us discuss about how RAIN RFID and other AIDC technologies will solve your deployment and asset tracking challenges. For registration please click here.

30 08, 2018

CISC is exhibiting at RFID & Wireless IoT tomorrow 2018, from 30th to 31st October.

August 30th, 2018|Allgemein, Events, News, Tech Talk|0 Comments

CISC will exhibit its latest full comprehensive UHF RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2, RAIN RFID and also Chinese standards like GB/T 29768 at the RFID & Wireless IoT tomorrow in Darmstadt, Germany. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests Reader [...]

12 07, 2018

CISC is exhibiting at IOTE Shenzhen, China from 31st July -2nd Aug, 2018

July 12th, 2018|Allgemein, Events, News|0 Comments

CISC will exhibit its latest full comprehensive UHF RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2, RAIN RFID and also Chinese standards like GB/T 29768 at the Internet of Things Exhibition in Shenzhen, China. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests Reader performance tests [...]

24 05, 2018
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Debangana Mukherjee appointed to the Board of Directors AIM North America

May 24th, 2018|Allgemein, Media, News|0 Comments

CISC Semiconductor (CISC) is pleased to announce the appointment of Debangana Mukherjee to the Board of Directors of the Association for Automatic Identification & Mobility (AIM) North America (NA) chapter, an alliance enabling the cooperation, development, standardization of AIDC technologies.  “CISC is committed towards enabling the growth and standardization of testing and verification of the RAIN RFID [...]

14 05, 2018

Webinar: Understanding the sensitivity of RAIN RFID Readers

May 14th, 2018|Allgemein, Events, News|0 Comments

You are Invited! Webinar: Understanding the sensitivity of RAIN RFID Readers. Every RAIN RFID Reader needs to be accurate, efficient and must have a good sensitivity in order for it to detect the tag signal in background noise. But the sensitivity of the readers are more often limited by different factors. Want to learn more [...]

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