About Josef Preishuber-Pflügl

EVP, CTO, Business Manager RFID+NFC
25 05, 2016

CISC launches first RAIN RFID Reader Tester – Webinar on 3 June 2016

May 25th, 2016|Events|0 Comments

CISC Semiconductor has launched the first CISC RFID Xplorer – Reader Tester based on the latest RAIN RFID reader performance test procedure. This tool is used for testing the RAIN RFID UHF readers covering the measurement of reader performance parameters, such as receiver sensitivity, and reader compliance testing. Its built-in sniffer functionality provides a comprehensive [...]

25 04, 2016

European UHF RFID still only in the 865-868 MHz band

April 25th, 2016|Blog|0 Comments

Today CISC hosted the ETSI ERM  TG34 Meeting for RFID. It is positive to say that the difficulties and challenges for UHF RFID in Europe that came up in fall 2015 have calmed down again. On the other side it is concerning that the 915-921 MHz band released by CEPT already in 2015 and supported [...]

14 03, 2016

Case Study: IP-XACT Extensions for Safety-Critical Embedded Systems

March 14th, 2016|Events, News|0 Comments

Ralph Weissnegger from CISC Semiconductor is giving a talk at Design, Automation and Test Conference 2016 (DATE) in Dresden (March 17th, 2016) about the new feature in new CISC tool SHARC to enhance and speed-up reliability-testing for automotive safety-critical systems.

11 03, 2016

NFC Interoperability white paper

March 11th, 2016|News|0 Comments

CISC issued a white paper on NFC Interoperability testing. This papers highlights the incredible growth and ubiquitous use of smartphones in all aspects of our daily lives. In particular various initiatives are under way to use smartphones in ‘card emulation’ mode to replace plastic contactless credit cards. In order to ensure great customer experience with mobile [...]

11 03, 2016

CISC will exhibit and speech on NFC Fachtagung 2016 in Seibersdorf, Austria

March 11th, 2016|News|0 Comments

CISC CTO will speak on NFC Fachtagung 2016  in Seibersdorf, Austria on Interoperability as Key to Successful NFC Deployment.

19 02, 2016

CISC Semiconductor and MET Labs Work Together to Provide GS1 EPC Gen2v2 Compliance Tests.

February 19th, 2016|News|0 Comments

CISC Semiconductor and MET Labs have joined forces to work together to provide GS1 EPC Gen2v2 Compliance. CISC already provides Gen2v2 test support on its UHF RFID test equipment now and will have available the ratified version in June 2015. For the PRESS RELEASE please click here.

29 01, 2016

CISC has joined NFC Forum

January 29th, 2016|News|0 Comments

In 2016 CISC has joined NFC-Forum in order to even better collaborate with our customers and actively participate in the NFC ecosystem. Having more than 10 years successful experience in HF and UHF RFID testing equipment, CISC has been developing its NFC competence and business in the last 5 years. Our NFC test solutions and [...]

19 01, 2016

CISC is exhibiting RFID Journal Live! – See us at booth #845

January 19th, 2016|Events, News|0 Comments

CISC Semiconductor will be exhibiting at  RFID Journal Live! 2016 in Orlando. Please feel free to stop by our booth #845 from May 3rd to 5th 2016. We are looking forward to meeting you! Please contact us if you would like to make an appointment.

10 12, 2015

CISC Semiconductor releases improved “UHF RFID Real Time Sniffer” for reader and application testing

December 10th, 2015|News|0 Comments

CISC Semiconductor is happy to announce the release of new and improved UHF RFID real-time “Sniffer” for CISC RFID Xplorer; a versatile equipment to resolve all tag and reader performance, RFID deployment and chip development issues. Sniffer is a tool to analyze RFID reader and tag signals and communication. The detection and decoding of reader [...]

25 02, 2015

CISC RFID Xplorer ready to perform tagged-item testing

February 25th, 2015|News|0 Comments

CISC RFID Xplorer is ready to perform measurement tests based on “tagged-item test procedure” defined by the GS1 Tagged Item Performance Protocol (TIPP) Guideline. This test is used as criteria for establishing that a tagged-item meets a specified grade level. For the complete information please read the PRESS RELEASE.

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