CISC Semiconductor has launched the first CISC RFID Xplorer – Reader Tester based on the latest RAIN RFID reader performance test procedure. This tool is used for testing the RAIN RFID UHF readers covering the measurement of reader performance parameters, such as receiver sensitivity, and reader compliance testing. Its built-in sniffer functionality provides a comprehensive [...]
Today CISC hosted the ETSI ERM TG34 Meeting for RFID. It is positive to say that the difficulties and challenges for UHF RFID in Europe that came up in fall 2015 have calmed down again. On the other side it is concerning that the 915-921 MHz band released by CEPT already in 2015 and supported [...]
Ralph Weissnegger from CISC Semiconductor is giving a talk at Design, Automation and Test Conference 2016 (DATE) in Dresden (March 17th, 2016) about the new feature in new CISC tool SHARC to enhance and speed-up reliability-testing for automotive safety-critical systems.
CISC issued a white paper on NFC Interoperability testing. This papers highlights the incredible growth and ubiquitous use of smartphones in all aspects of our daily lives. In particular various initiatives are under way to use smartphones in ‘card emulation’ mode to replace plastic contactless credit cards. In order to ensure great customer experience with mobile [...]
CISC CTO will speak on NFC Fachtagung 2016 in Seibersdorf, Austria on Interoperability as Key to Successful NFC Deployment.
CISC Semiconductor and MET Labs have joined forces to work together to provide GS1 EPC Gen2v2 Compliance. CISC already provides Gen2v2 test support on its UHF RFID test equipment now and will have available the ratified version in June 2015. For the PRESS RELEASE please click here.
In 2016 CISC has joined NFC-Forum in order to even better collaborate with our customers and actively participate in the NFC ecosystem. Having more than 10 years successful experience in HF and UHF RFID testing equipment, CISC has been developing its NFC competence and business in the last 5 years. Our NFC test solutions and [...]
CISC Semiconductor will be exhibiting at RFID Journal Live! 2016 in Orlando. Please feel free to stop by our booth #845 from May 3rd to 5th 2016. We are looking forward to meeting you! Please contact us if you would like to make an appointment.
CISC Semiconductor releases improved “UHF RFID Real Time Sniffer” for reader and application testing
CISC Semiconductor is happy to announce the release of new and improved UHF RFID real-time “Sniffer” for CISC RFID Xplorer; a versatile equipment to resolve all tag and reader performance, RFID deployment and chip development issues. Sniffer is a tool to analyze RFID reader and tag signals and communication. The detection and decoding of reader [...]
CISC RFID Xplorer is ready to perform measurement tests based on “tagged-item test procedure” defined by the GS1 Tagged Item Performance Protocol (TIPP) Guideline. This test is used as criteria for establishing that a tagged-item meets a specified grade level. For the complete information please read the PRESS RELEASE.