CISC RFID Xplorer is ready to perform measurement tests based on “tagged-item test procedure” defined by the GS1 Tagged Item Performance Protocol (TIPP) Guideline. This test is used as criteria for establishing that a tagged-item meets a specified grade level. For the complete information please read the PRESS RELEASE.
CISC Semiconductor strengthens its global presence by adding new partners in global key locations. Klagenfurt, Austria – 16 September. CISC Semiconductor (CISC) is pleased to announce that 3 new partners have joined CISC to provide CISC RFID/NFC test and measurement solutions and to maximize the existing customer satisfaction. This will ensure prompt local support on [...]
CISC Semiconductor is pleased to announce that we are now a member of the RAIN Alliance. RAIN is an industry alliance that will promote awareness, education, and initiatives to accelerate UHF RFID growth and adoption in business and consumer applications worldwide.
Josef Preishuber-Pflügl is the chief technology officer of CISC Semiconductor and the head of the International RFID Institute's Certification Committee, is seeking SMEs to help us increase their database of certification questions, and to create new certification exams. To read the full article please click here.