RFID Based Pallets Tracking

CASE STUDY

RFID Xplorer simplifies RFID tagging of large pallets in logistics

Simple testing of large pallets

A change in the test setup consisting of special helical test antennas, a high power amplifier, and the standard Xplorer test unit is the solution for testing tags on large pallets. The bi-static setup consists of two antennas with high directivity and extremely low leakage from the transmitter to the receiver even at high transmit power. This maintains superior sensitivity of the test unit to characterize tags, which would be otherwise not detectable by a standard RFID reader.

Superior sensitivity of RFID Xplorer unit to characterize tags

Tag performance testing is about quantifying the sensitivity and other parameters of the tags/tagged items. There should be no impact on the reader/test instrument on the results. Therefore, only  high-performing test equipment like RFID Xplorer can characterize even the weakest tag on a pallet.

 

 

Understand tag placement

The right location for the RAIN RFID tag needs to be determined depending on the power level received by the tag at that given location. In some cases the minimum turn on power is high and in others quite low. By running a continuous power level sweep by the Xplorer test unit we can determine the optimum location to place the tag thereby ensuring successful deployment.

Verifies the reader, selects the right tag

In a multi-tag environment the reader needs to select the right tag from the mix. Support engineers use Xplorer during the implementation phase to verify the encoding done on the tags. In case of mismatch they use RFID Xplorer sniffer to locate the exact source of the error. This debugging process takes only a fraction of seconds.

Results

  • Finding the exact location to place the tag on a pallet
  • Significant decrease in time during debugging
  • Higher success of the project when tested with a certified RFID test equipment

Used product
in this case study

RAIN RFID Xplorer

High-precision RFID test instrument

Learn more
Contact your Expert

Debangana Mukherjee

Your contact Person

d.mukherjee@cisc-semiconductor.com

 

 

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