NFC Xplorer Inline

High Speed Quality Assurance and Encoding

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NFC Performance Testing
During Production

The CISC NFC Xplorer Inline is a unit for high-speed quality assurance testing of NFC inlays and tags during the production process. It offers quality assurance during the production process from start to end which includes performance testing and encoding. NFC Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.

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NFC Xplorer inline is a quality assurance test tool that additionally allows encoding of NFC and HF RFID tags and labels. The device is setup to support the maximum speed allowed by the protocol and the tag chip.The device consists of 2 elements, the NFC Xplorer Inline itself and a test antenna (set). A Secure Access Module, the MIFARE SAM AV3, is provided optionally.

A set of 3 test antennas together with square and round shielding panels are provided covering all NFC tag type classes 1-6 to meet production testing requirements for any kind of NFC tags and labels.

 

 

 

The results table give full overview of the quality assurance testing including the possibility to save it as a report. 

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