RFID Production performance Testing
RAIN Xplorer Inline is a Test Solution for High-Speed Quality Assurance and Encoding.
RFID Performance Testing During Production
The CISC RAIN Xplorer Inline is a unit for high-speed performance testing of RAIN RFID inlays and tags during the production process. It offers quality assurance during the production process from start to end. RAIN Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.
Encoding and Locking
The RFID Xplorer Inline system is designed to efficiently encode, test, and lock data on RFID labels in a single, streamlined process. This advanced capability ensures that each RFID label is accurately encoded with the correct data, rigorously tested for performance, and securely locked to prevent unauthorized alterations. By consolidating these steps, the system significantly boosts production efficiency, minimizes the risk of human error, and guarantees the reliability and security of every RFID label. This makes it an essential solution for managing high volumes of RFID labels with precision and confidence.
Key Benefits
- More flexibility in creating an own performance matrix
- Better analysis while saving time and cost
- Testing for performance on multiple frequencies on a single RAIN RFID inlay tag at high speedÂ
- Improves overall quality of the product
- Full quality assurance in production
- Security, crypto support (SAM, TAM)
Key Features
- 800 MHz to 1 GHz
- TX power range from -10 dBm to 28 dBm
- Sensitivity up to -80 dBm
- Read EPC, TID and memory
- Encoding (Write memory)
- Measure tag sensitivity over frequency
- Test time starting at 6 ms per single read EPC test point
- Linear test time scaling, e.g. 30 ms for 5 read EPC test points
- 100k UPH testing for 5 power/frequency pairs on EPC and reporting TID
- GPIO for external trigger
- Serial interface for communication
RAIN Xplorer Inline is a tag performance test tool that additionally allows encoding of RAIN RFID tags and labels. The device is setup that it supports up to 100k UPH for testing the essential points of the tags resonance behaviour, which means 5 power/frequency pairs on EPC and reporting EPC and TID of each tag additional to the pass/fail result. The device consists of 2 elements, the RAIN Xplorer Inline itself and a test antenna. A Secure Access Module, the MIFARE SAM AV3, is provided optionally.
Both inductive and capacitive test antennas with multiple flexible shielding options are provided to meet UHF RFID production testing requirements for any kind of RAIN tags and labels.
The performance test support mode supports reference tag measurements to easily extract performance criteria for the tags. These parameters are then used to define criteria for the high volume quality assurance testing.
SOFTWARE Maintenance Service
Maintenance means the provisioning of regular Updates for the software of the Product. CISC Semiconductor provides Updates on a schedule of approx. six (6) months (typically two times in a year). These updates don’t add completely new features but focus on maintaining top performance, ensuring compatibility, provide continuous improvements in functionality of the Product, continuous usability enhancements and necessary security updates. Updates are made available online under www.cisc.at/support for the Licensee’s Technical Contact(s). Note: Upgrades are not part of the Maintenance.
Cost: Maintenance is optional. It is provided in the form of Updates of the software for the Product purchased by the Licensee. Maintenance must be purchased by Licensee in advance for an annual extension of 20% of the current license price of the at the date of order. Extensions of Maintenance may also be purchased for more than one year.
For every purchase of the product Maintenance is included for the first twelve (12) months after purchase (shipment date) for free.
Main Feature Overview
Release: Build_250515
General
Support of Ethernet communication with RAIN Xplorer Inline V5.0
Update CIU FW with RAIN Xplorer Inline – Service Cable is no longer required
Faster Encoding through BlockWrite command
Encode EPC and Access Password in one step
Send out data over TCP queue to printer
Option to define CIU Result pulse offset as offset from trigger
Support of additional result pulse handling
Prevent multiple triggers for the same tag by filtering events closer than the specified pitch
delayChange of the default installation directory
GUI
Minor updates and improvements
API
New function for power setting conversion
Release: Build_250331
API
- Support of Ethernet communication with RAIN Xplorer Inline V5.0
- Power setting conversion function included
Release: Build_240731
General
- Encoding feature including optional
- Encode incremental data by defining start data, memory bank and address
GUI
- Minor improvements
API
- Read TID
- Access Tag by Password
- Lock tag memory
Release: Build_240201
General
- Â Test speed improvement
GUI
Major GUI Redesign
New result display
Expert and non-expert view
Introduction of simple settings for lane and test configuration
Support of Windows 11
Fine-adjustment of CIU parameters
Release: Build_230430
General
Controllable Interface Unit functionalities added
Introduced various signaling interface controls
Update of UART Control to use 115.2 kbit/s as default baud rate
GUI
Update to 64-bit application
Writing different data to tags during quality assurance tests taken from a text file
Report includes information on the failing test points in case multiple test points are defined
Minor bug fixes and improvements
API
Introduced 64-bit DLL in addition to 32-bit version
Writing different data to tags using data buffer in RAIN Xplorer Inline unit
Report RSSI Log value for all test points
Report Pass/Fail result for all test points
Minor bug fixes and improvements
Release: Build_220331
GeneralÂ
- License dongle free operation by saving license information on device.
- Controlling of up to four devices with single GUI or API.
- Controlling of device via UART over GPIO connector pins.
GUI
- Control of up to four devices with single GUI.
- Display of pass / fail distribution for all connected devices separately for quality assurance
tests. - Improved GUI update speed.
- Measurement report including device name.
- License dongle free operation, if licenses are stored on device.
- Minor improvements and bug fixes.
APIÂ
- Added Reel2Reel Tester movement example.
- Added example for multiple Xplorer Inline control.
- Added functions for handling multiple Xplorer Inline devices.
- Additional *.dll for license dongle free operation, if licenses are stored on device.
- Minor improvements.
Release: Build_211109
GeneralÂ
Added optional lower limit for pass/fail decision in quality assurance test.
Report PC and XPC bits of tested tags.
New command sequences for quality assurance test added:
Query
Query + Single EPC read
Query + Single TID read
Fast EPC + Single memory read
Support Rev1 for TAM2 in combination with SAM AV3.
Extend power measurement range.
Store calibration values on device.
Improved antenna tuning algorithm.
GUI
Display power measurement range in frequency sweep graph.
Display current limit settings from quality assurance in frequency sweep graph.
Calculation of standard deviation and average of frequency sweep results.
Get limits for quality assurance test from frequency sweep results out of standard deviation,
average or minimum and maximum values.Antenna tuning performed at start of application for improved sensitivity of device.
Minor improvements and bug fixes.
APIÂ
Bug fix in Reel2Reel Tester movement commands.
Added functions for handling the automatic stop when end of reel reached.
Minor improvements.



