RFID Production performance
Testing

RAIN Xplorer Inline is a Test Solution for High-Speed Quality Assurance.

RFID Performance Testing During Production

The CISC RAIN Xplorer Inline is a unit for high-speed performance testing of RAIN RFID inlays and tags during the production process. It offers quality assurance during the production process from start to end. RAIN Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.

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Key Benefits

  • More flexibility in creating an own performance matrix
  • Better analysis while saving time and cost
  • Testing for performance on multiple frequencies on a single RAIN RFID inlay tag at high speed 
  • Improves overall quality of the product
  • Full quality assurance in production
  • Security, crypto support (SAM, TAM)

Key Features

  • 800 MHz to 1 GHz
  • TX power range from -10 dBm to 28 dBm
  • Sensitivity up to -80 dBm
  • Read EPC, TID and memory
  • Encoding (Write memory)
  • Measure tag sensitivity over frequency
  • Test time starting at 6 ms per single read EPC test point
  • Linear test time scaling, e.g. 30 ms for 5 read EPC test points
  • 100k UPH testing for 5 power/frequency pairs on EPC and reporting TID
  • GPIO for external trigger
  • Serial interface for communication

Downloads of RAIN Xplorer Inline

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