NFC Measurement Solution

NFC Xplorer is a Pristine RF Testing Device According to ISO Test Setup

Conformance and
Performance Tests

The CISC NFC Xplorer is a compact, high-quality test system, developed for NFC and HF device measurements including performance and conformance tests. The Hardware unit provides two high-ohm input ports and one 50-ohm output port, which makes the NFC Xplorer a device supporting measurements according ISO with full compensation of DUT influence. The device is capable of communicating with HF RFID cards and NFC devices, and an analyzer of the air interface communication. Signal recording is done in real-time with no limitation of the recording time.

Key Benefits

  • High precision
  • Fast and easy to use GUI
  • Multiple protocols
  • Standard and user-defined commands
  • Configuration as tag tester for up to 12 A/m
  • Configuration as sniffer and reader tester
  • Two receivers for pristine support of ISO test setup

Key Features

  • Resonance frequency measurements
  • Load modulation measurements independence of H-Field
  • Full analog testing
  • Multiprotocol supports
    • ISO/IEC 14443A/B
    • ISO/IEC 15693
    • ISO/IEC 18092
    • ISO/IEC 18000-3M3

Related Case Studies,
Related Posts

Blog

Walmart mandate

News

CISC wins 2 prestigious awards

Case Study

CONTACTLESS PAYMENT

Ensure reliability of payment terminals with the best settings of NFC design parameters

Case Study

Axzon - Tag Performance Testing

Detect and decode reader commands and tag responses in real-time

News

RAIN XPLORER SPY launch

Blog

Employee Spotlight Blaz

Case Study

CAEN RFID

Active optimized reader sensitivity with the right architecture and configurations in reader design

Case Study

LicenSys - Tag Perfomance Testing

Design high performance vehicle licence plates

Case Study

PALLETS TRACKING

How to simplify testing of RFID tags for pallets used tin logistics and supply chain

Blog

TOP 5 RFID READER ISSUES AND HOW TO SOLVE THEM

News

WHITEPAPER: MEASUREMENT METHODS AND TEST STANDARDS

Case Study

EM Microelectronic - Tag Conformance Testing

Shorten RFID IC development time with the right test equipment